大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 Peter J. (Peter John) 的图书(共7587本)

Computer aided circuit design

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索取号:TN7/E8010
作者:Fidler、 J. K. (John Kelvin)、Nightingale、 C.、 joint author.、
出版社:Sunbury-on-Thames [etc.] : Nelson, 1978.

The bugbook III : Micro computer intferfacing

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索取号:TN6/E801/3
作者:Larsen、 David G.、Rony、 Peter R.、 joint author.、Titus、 Jonathan A.、 joint author.、
出版社:Virginia Derby, Conn. : E & L Instruments, 1975.

The bugbook II : Logic & Memory experiments m

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索取号:TN6/E801/2
作者:Larsen、 David G.、Rony、 Peter R.、 joint author.、Titus、 Jonathan A.、 joint author.、
出版社:Virginia Derby, Conn. : E & L Instruments, 1974.

The bugbook I : Logic & Memory experiments m

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索取号:TN6/E801/1
作者:Larsen、 David G.、Rony、 Peter R.、 joint author.、Titus、 Jonathan A.、 joint author.、
出版社:Virginia Derby, Conn. : E & L Instruments, 1974.

Introduction to MOS LSI design

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索取号:TN47/E9038
作者:Mavor、 J.、Jack、 Mervyn A.、 1949-、Denyer、 P. B. (Peter B.)、 1953-、
出版社:London : Addison-Wesley, 1983.

Handbook of simplified solid state circuit design

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索取号:TN43-62/E803.2
作者:Lenk、 John D.、
出版社:Englewood Cliffs, N.J. : Prentice-Hall, 1978.

Radio circuits explained

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索取号:TN43/E803
作者:King、 Gordon John.、
出版社:London : Newnes Technical Books, 1977.

Semiconductor and integrated circuit fabrication techniques

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索取号:TN43/E801
作者:Gise、 Peter E.、Blanchard、 Richard、 joint author.、Fairchild Management and Career Development Center.、Fairchild Camera and Instrument Co.、
出版社:Reston, Va. : Reston Pub. Co., 1979.

Handbook of integrated circuits : for engineers and technicians

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索取号:TN4-62/E802
作者:Lenk、 John D.、
出版社:Reston, Va. : Reston Pub. Co., 1978.

Electron microscopy of thin crystals

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索取号:TN27/E801
作者:Hirsch、 P. B. (Peter Bernhard)、
出版社:London Buterworth Huntington, N.Y. : R. E. Krieger Pub. Co., 1965,c1977.

Doing pragmatics

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索取号:H030/E994.2
作者:Grundy、 Peter.、
出版社:London : Arnold ; New York : Co-published in the U.S.A. by Oxford University Press, 2000.

Introduction to marketing

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索取号:F713.5/E9017.4
作者:Frain、 John.、
出版社:London : Thomson, 1999.

Image processing : February 24-26, 1976, Asilomar Conference Center, Pacific Grove, California

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索取号:TN27-53/E803
作者:Spie Seminar on Image Processing、 Asilomar Conference Center、 1976.、Urbach、 John C.、Optical Society of America.、Society of Photo-Optical Instrumentation Engineers.、
出版社:[Palos Verdes Estates, Calif.] : SPIE, 1976.

Proceedings of a workshop held at the National Bureau of Standards, Gaithersburg, MD, June 3-4, 1976

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索取号:TN27-53/E806/1976
作者:Workshop on Standards for Image Pattern Recognition、 National Bureau of Standards、 1976.、Evans、 John M. (John Martin)、 1942-、Kirsch、 Russell A.、Nagel、 Roger N.、 1943-、United States. National Bureau of Standards.、
出版社:[Washington] : GPO U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.

Semiconductor characterization techniques : proceedings of the Topical Conference on Characterization Techniques for Semiconductor Materials and Devices

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索取号:TN3-53/E802/1978
作者:Topical Conference on Characterization Techniques for Semiconductor Materials and Devices (1978 : Seattle、 Wash.)、Barnes、 Peter A.、Rozgonyi、 George A.、Electrochemical Society. Electronics Division.、
出版社:Princeton, N.J. : Electrochemical Society, 1978.

Electronic fundamentals and applications : integrated and discrete systems

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索取号:TN301/E801.5
作者:Ryder、 John Douglas、 1907-、
出版社:Jersey Englewood Cliffs, N.J. : Prentice-Hall, [1976]
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